TY - JOUR
T1 - Effects of ZnO buffer layers on growth, electrical properties and crystallinity of vanadium-doped ZnO
AU - Okada, Takeru
AU - Kawashima, Tomoyuki
AU - Mori, Tatsuya
AU - Washio, Katsuyoshi
N1 - Publisher Copyright:
© 2020 Elsevier B.V.
PY - 2020/5/1
Y1 - 2020/5/1
N2 - Transparent conductive oxides have attracted much attention in the field of optoelectronic device applications. Among these materials, vanadium-doped zinc oxide is unique for its piezoelectricity, transparency, and electric conductivity. In this paper, we investigate the effects of zinc oxide buffer layers on the formation of vanadium-doped zinc oxide. We find that zinc oxide buffer layer thicker than 10 nm has oriented crystal structure, and promote the formation of highly oriented vanadium-doped zinc oxide by reducing electrically inactive layer at the interface. Our investigation indicates that zinc-oxide-based conductive film can be formed by introducing the buffer layer under appropriate conditions. These results provide important information for industrial application of transparent conductive materials.
AB - Transparent conductive oxides have attracted much attention in the field of optoelectronic device applications. Among these materials, vanadium-doped zinc oxide is unique for its piezoelectricity, transparency, and electric conductivity. In this paper, we investigate the effects of zinc oxide buffer layers on the formation of vanadium-doped zinc oxide. We find that zinc oxide buffer layer thicker than 10 nm has oriented crystal structure, and promote the formation of highly oriented vanadium-doped zinc oxide by reducing electrically inactive layer at the interface. Our investigation indicates that zinc-oxide-based conductive film can be formed by introducing the buffer layer under appropriate conditions. These results provide important information for industrial application of transparent conductive materials.
KW - Transparent conductive oxides
KW - Vanadium-doped zinc oxide
KW - Zinc oxide
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U2 - 10.1016/j.tsf.2020.137954
DO - 10.1016/j.tsf.2020.137954
M3 - Article
AN - SCOPUS:85081949372
SN - 0040-6090
VL - 701
JO - Thin Solid Films
JF - Thin Solid Films
M1 - 137954
ER -