TY - JOUR
T1 - Efficient approach to measure crystallization temperature in amorphous thin film by infrared reflectivity
AU - Wang, Wenxiu
AU - Saito, Shin
AU - Yakabe, Hidetaka
AU - Takahashi, Migaku
PY - 2013
Y1 - 2013
N2 - This paper shows a new effective approach to measure crystallization temperature of soft magnetic underlayer (SUL) for next generation of heat assisted perpendicular recording media. This approach uses temperature dependent reflectivity, which shows a clear jump when samples are crystallized. To achieve this measurement, an optical system is set up using hot plate and infrared laser. Reflectivity of SUL (Co70Fe30)92Ta3Zr5 shows a clear jump at its amorphous-crystalline transition temperature. Experiment results show this effect is clear in infrared region, and is weak for visible light.
AB - This paper shows a new effective approach to measure crystallization temperature of soft magnetic underlayer (SUL) for next generation of heat assisted perpendicular recording media. This approach uses temperature dependent reflectivity, which shows a clear jump when samples are crystallized. To achieve this measurement, an optical system is set up using hot plate and infrared laser. Reflectivity of SUL (Co70Fe30)92Ta3Zr5 shows a clear jump at its amorphous-crystalline transition temperature. Experiment results show this effect is clear in infrared region, and is weak for visible light.
KW - Amorphous thin film
KW - Optical property
KW - Perpendicular recording media
KW - Soft magnetic thin film
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U2 - 10.4283/JMAG.2013.18.2.086
DO - 10.4283/JMAG.2013.18.2.086
M3 - Article
AN - SCOPUS:84879512190
SN - 1226-1750
VL - 18
SP - 86
EP - 89
JO - Journal of Magnetics
JF - Journal of Magnetics
IS - 2
ER -