TY - JOUR
T1 - Electrical and thermal recording techniques using a heater integrated microprobe
AU - Lee, Dong Weon
AU - Ono, Takahito
AU - Esashi, Masayoshi
PY - 2002/11
Y1 - 2002/11
N2 - In this paper, we describe the fabrication of a heater integrated microprobe and we propose microprobe-based electrical and thermal recording techniques for application to high-density data storage. The small heater with a sharp tip is located at the free end of the microprobe and can be heated up electrically by flowing a pulsed current through the microprobe legs. The generated heat is transferred to the media through the tip to create a bit. The dimensions of the small heater are minimized to reduce the power consumption and increase the thermal response. For the electrical recording on the thin Pb(ZrTi)O3 (PZT) film, a pulse voltage is applied between the conductive tip and the bottom Pt electrode, which induces a local polarization of the PZT. To read the direction of the local polarization, the static deflection of the microprobe is measured through a lock-in amplifier while the tip with small ac voltage is traveling on the PZT medium. For the thermal recording on the thin AgInSbTe film, the small heater is employed instead of a focused laser. The electrical resistance between the tip and the bottom Pt electrode is directly measured to read the phase information in a local region. The recording marks on both materials are below 100 nm in diameter, which corresponds to the areal density of 100 Gb in.-2.
AB - In this paper, we describe the fabrication of a heater integrated microprobe and we propose microprobe-based electrical and thermal recording techniques for application to high-density data storage. The small heater with a sharp tip is located at the free end of the microprobe and can be heated up electrically by flowing a pulsed current through the microprobe legs. The generated heat is transferred to the media through the tip to create a bit. The dimensions of the small heater are minimized to reduce the power consumption and increase the thermal response. For the electrical recording on the thin Pb(ZrTi)O3 (PZT) film, a pulse voltage is applied between the conductive tip and the bottom Pt electrode, which induces a local polarization of the PZT. To read the direction of the local polarization, the static deflection of the microprobe is measured through a lock-in amplifier while the tip with small ac voltage is traveling on the PZT medium. For the thermal recording on the thin AgInSbTe film, the small heater is employed instead of a focused laser. The electrical resistance between the tip and the bottom Pt electrode is directly measured to read the phase information in a local region. The recording marks on both materials are below 100 nm in diameter, which corresponds to the areal density of 100 Gb in.-2.
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U2 - 10.1088/0960-1317/12/6/315
DO - 10.1088/0960-1317/12/6/315
M3 - Article
AN - SCOPUS:0036852769
SN - 0960-1317
VL - 12
SP - 841
EP - 848
JO - Journal of Micromechanics and Microengineering
JF - Journal of Micromechanics and Microengineering
IS - 6
ER -