Abstract
Resistivity enhancement by 5 orders or more was realized by Ga focused ion beam implantation into n+ and p+ GaAs epilayers. For originally n+ epilayers, this resistivity enhancement is maintained after annealing as high as 800°C. However this enhancement disappears after annealing at above 650°C for p+ epilayer. This property makes GaAs high resistive only in a limited area whose minimum dimension is 0.1 µm or less, and is attractive for a device fabrication process to electrically isolate integrated elements.
Original language | English |
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Pages (from-to) | L965-L967 |
Journal | Japanese Journal of Applied Physics |
Volume | 24 |
Issue number | 12 |
DOIs | |
Publication status | Published - 1985 Dec |