Electrochemical properties of Fe2O3-Cr 2O3 thin films and pitting behavior of Fe-Cr alloys in neutral NaCl solutions

Katsuhisa Sugimoto, Yoshiyuki Ohya, Noboru Akao, Nobuyoshi Hara

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)


Fe2O3-Cr2O3 thin films with various chromium cationic fractions, XCr, were prepared by ion-beam sputter deposition. The thinning rate of the films in 0-1M Cl -containing solutions with pH 0.2 - 8.0 was measured in-situ by using an automatic ellipsometer. The pitting behavior of vacuum induction melted Fe-Cr alloys with 10-30% Cr was also measured in IM Cl -containing solutions with pH 0.2 - 5.9. The composition of passive films on the alloys was analyzed by AES. Pit initiation sites were observed by SEM and analyzed by EPMA. The results showed pitting on the Fe-20Cr alloy in IM NaCl starts at Cr2O3 inclusions partly covered by sulfide. It is presumed that the XCr value of repassivation film formed inside a pit determines the repassivation of the pit through the suppression or no suppression of the reductive dissolution of the film.

Original languageEnglish
Title of host publicationPits and Pores III
Subtitle of host publicationFormation, Properties, and Significance for Advanced Materials - Proceedings of the International Symposium
Number of pages11
Publication statusPublished - 2006
Event206th Electrochemical Society Meeting - Honolulu, HI, United States
Duration: 2004 Oct 32004 Oct 8

Publication series

NameProceedings - Electrochemical Society
VolumePV 2004-19


Conference206th Electrochemical Society Meeting
Country/TerritoryUnited States
CityHonolulu, HI


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