Electromagnetic near field measurements by using magnet garnet crystal

M. Takahashi; K. Kawasaki; H. Ohba; T. Ikenaga; H. Ota; T. Orikasa; N. Adachi; K. Ishiyama; K. I. Arai

doi:10.1063/1.3337726

Electromagnetic near field measurements by using magnet garnet crystal

M. Takahashi, K. Kawasaki, H. Ohba, T. Ikenaga, H. Ota, T. Orikasa, N. Adachi, K. Ishiyama, K. I. Arai

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5 Citations (Scopus)

Abstract

An optical scanning electromagnetic field probe system consisting of an optic crystal substrate and a galvano scanner has been developed for high speed, low-invasive measurement of electromagnetic near field distribution. We measured magnetic field distributions above a microstrip line using several magnetic garnet crystal substrates and the probe system. We observed that the frequency response in the gigahertz range improved when we applied a magnetic bias to the crystal. In addition, a magnetic field component in a particular direction could be detected by controlling the direction of the magnetic bias.

Original language	English
Article number	09E711
Journal	Journal of Applied Physics
Volume	107
Issue number	9
DOIs	https://doi.org/10.1063/1.3337726
Publication status	Published - 2010 May 1

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1063/1.3337726

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title = "Electromagnetic near field measurements by using magnet garnet crystal",

abstract = "An optical scanning electromagnetic field probe system consisting of an optic crystal substrate and a galvano scanner has been developed for high speed, low-invasive measurement of electromagnetic near field distribution. We measured magnetic field distributions above a microstrip line using several magnetic garnet crystal substrates and the probe system. We observed that the frequency response in the gigahertz range improved when we applied a magnetic bias to the crystal. In addition, a magnetic field component in a particular direction could be detected by controlling the direction of the magnetic bias.",

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T1 - Electromagnetic near field measurements by using magnet garnet crystal

AU - Takahashi, M.

AU - Kawasaki, K.

AU - Ohba, H.

AU - Ikenaga, T.

AU - Ota, H.

AU - Orikasa, T.

AU - Adachi, N.

AU - Ishiyama, K.

AU - Arai, K. I.

N1 - Funding Information: This work was supported financially in part by Strategic Information and Communications R&D Promotion Programme, Ministry of Internal Affairs and Communications, Japan.

PY - 2010/5/1

Y1 - 2010/5/1

N2 - An optical scanning electromagnetic field probe system consisting of an optic crystal substrate and a galvano scanner has been developed for high speed, low-invasive measurement of electromagnetic near field distribution. We measured magnetic field distributions above a microstrip line using several magnetic garnet crystal substrates and the probe system. We observed that the frequency response in the gigahertz range improved when we applied a magnetic bias to the crystal. In addition, a magnetic field component in a particular direction could be detected by controlling the direction of the magnetic bias.

AB - An optical scanning electromagnetic field probe system consisting of an optic crystal substrate and a galvano scanner has been developed for high speed, low-invasive measurement of electromagnetic near field distribution. We measured magnetic field distributions above a microstrip line using several magnetic garnet crystal substrates and the probe system. We observed that the frequency response in the gigahertz range improved when we applied a magnetic bias to the crystal. In addition, a magnetic field component in a particular direction could be detected by controlling the direction of the magnetic bias.

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Electromagnetic near field measurements by using magnet garnet crystal

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