TY - JOUR
T1 - Electromagnetic properties of scanning tunneling microscope tip-sample gap in the terahertz frequency range
AU - Uehara, Yoichi
AU - Katano, Satoshi
AU - Kuwahara, Masashi
AU - Suzuki, Tetsu
N1 - Publisher Copyright:
© 2015 The Japan Society of Applied Physics.
PY - 2015/8/1
Y1 - 2015/8/1
N2 - We have investigated electromagnetic properties of the tip-sample gap of a scanning tunneling microscope (STM) in the terahertz (THz) spectral range. Light in the STM is emitted from the current source excited by tunneling electrons through dipole radiation processes. The antenna factor that measures the efficiency of the dipole radiation contains a factor proportional to the square of the angular frequency ω of the STM light. Hence, it might occur that STM light emissions in the THz spectral range become undetectably weak. The antenna factors for samples of Au and TiO2, whose plasma frequencies are in the UV and THz spectral ranges, respectively, were investigated as a function of the radius a of curvarure of the W tip. We have found that the effect of ω2 in the antenna factor can be compensated for using a tip having an a of approximately 1500 nm.
AB - We have investigated electromagnetic properties of the tip-sample gap of a scanning tunneling microscope (STM) in the terahertz (THz) spectral range. Light in the STM is emitted from the current source excited by tunneling electrons through dipole radiation processes. The antenna factor that measures the efficiency of the dipole radiation contains a factor proportional to the square of the angular frequency ω of the STM light. Hence, it might occur that STM light emissions in the THz spectral range become undetectably weak. The antenna factors for samples of Au and TiO2, whose plasma frequencies are in the UV and THz spectral ranges, respectively, were investigated as a function of the radius a of curvarure of the W tip. We have found that the effect of ω2 in the antenna factor can be compensated for using a tip having an a of approximately 1500 nm.
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U2 - 10.7567/JJAP.54.08LB06
DO - 10.7567/JJAP.54.08LB06
M3 - Article
AN - SCOPUS:84938316938
SN - 0021-4922
VL - 54
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
IS - 8
M1 - 08LB06
ER -