Abstract
The ion-electron structure factor of liquid Ga has been estimated from the anomalous X-ray scattering (AXS) measurements near the Ga K-absorption edge for determining the electron density distribution. This data processing includes the help of the reverse Monte Carlo (RMC) simulation technique and the results clearly indicate that the electron density of liquid Ga significantly deviates from spherical distribution with respect to each central Ga ion.
| Original language | English |
|---|---|
| Pages (from-to) | 393-403 |
| Number of pages | 11 |
| Journal | High Temperature Materials and Processes |
| Volume | 29 |
| Issue number | 5-6 |
| DOIs | |
| Publication status | Published - 2010 |
Keywords
- Anomalous x-ray scattering
- Electron density distribution
- Ion-electron structure factor
- Liquid gallium
- Reverse monte carlo simulation
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Physical and Theoretical Chemistry