TY - GEN
T1 - Electron emission mechanism of doped CVD diamond characterized using combined XPS/UPS/FES system
AU - Yamaguchi, Hisato
AU - Saito, Ichitaro
AU - Kudo, Yuki
AU - Masuzawa, Tomoaki
AU - Yamada, Takatoshi
AU - Kudo, Masato
AU - Takakuwa, Yuji
AU - Okano, Kem
PY - 2007
Y1 - 2007
N2 - Electric field of less than 5 V/μm is enough to extract electrons from diamond, whereas field of one to two orders of magnitude higher is needed to extract electrons from metal emitter tips. Despite such low-threshold field, the difficulty in clarification of electron emission mechanism is the factor preventing diamond from being used in a practical application. Quite a few numbers of possible mechanisms were proposed to better understand the origin and properties of the observed emission. Most of these mechanisms, however, were based on the conventional I-V (Emission current-Anode voltage) characteristics. Energy distribution of the field-emitted electrons is essential in direct clarification of the mechanism, In this study, combined XPS/UPS/FES system was used to characterize the electron emission mechanism of doped chemical vapor deposited (CVD) diamond. The results indicated successful observation of the origin of field-emitted electrons from doped CVD diamond comparison with natural diamond, used as a reference.
AB - Electric field of less than 5 V/μm is enough to extract electrons from diamond, whereas field of one to two orders of magnitude higher is needed to extract electrons from metal emitter tips. Despite such low-threshold field, the difficulty in clarification of electron emission mechanism is the factor preventing diamond from being used in a practical application. Quite a few numbers of possible mechanisms were proposed to better understand the origin and properties of the observed emission. Most of these mechanisms, however, were based on the conventional I-V (Emission current-Anode voltage) characteristics. Energy distribution of the field-emitted electrons is essential in direct clarification of the mechanism, In this study, combined XPS/UPS/FES system was used to characterize the electron emission mechanism of doped chemical vapor deposited (CVD) diamond. The results indicated successful observation of the origin of field-emitted electrons from doped CVD diamond comparison with natural diamond, used as a reference.
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M3 - Conference contribution
AN - SCOPUS:40949155234
SN - 9781558999138
T3 - Materials Research Society Symposium Proceedings
SP - 215
EP - 220
BT - Diamond Electronics-Fundamentals to Applications
T2 - 2006 MRS Fall Meeting
Y2 - 27 November 2006 through 1 December 2006
ER -