Electron energy-loss and soft X-ray emission study of boron nanobelts

Yohei Sato, Masami Terauchi, Kazuhiro Kirihara, Takeshi Sasaki, Kenji Kawaguchi, Naoto Koshizaki, Kaoru Kimura

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12 Citations (Scopus)


Electronic structure of individual boron nanobelts, which supposedly have α-tetragonal boron structure, was studied with electron energy-loss spectroscopy (EELS) and soft X-ray emission spectroscopy (SXES) in a transmission electron microscope. A boron K-shell excitation spectrum by EELS and boron K-emission spectra by SXES correspond to partial density of states of the conduction and the valence bands, respectively. Experimental results reveal that boron nanobelts are either a semimetal or narrow-gap semiconductor.

Original languageEnglish
Article number012029
JournalJournal of Physics: Conference Series
Publication statusPublished - 2009


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