Abstract
We measure the glancing angle (g) dependence of In L emission from Si(111)- (3×3)-In structure during reflection high energy electron diffraction. The g dependence clearly showed some anomalous intensities under Bragg conditions. These intensities were well explained as a change of the density of electron standing waves on the surface adatoms. Using this phenomenon, a new method for adatom-height determination was developed, and the obtained In adatom height from the first Si layer was 1.83 in the T4 structure.
Original language | English |
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Pages (from-to) | 669-672 |
Number of pages | 4 |
Journal | Physical Review Letters |
Volume | 75 |
Issue number | 4 |
DOIs | |
Publication status | Published - 1995 |