TY - JOUR
T1 - Encapsulation of atomic-scale Bi wires in epitaxial silicon without loss of structure
AU - Sakata, Osami
AU - Yashiro, Wataru
AU - Bowler, D. R.
AU - Kitano, Akiko
AU - Sakamoto, Kunihiro
AU - Miki, Kazushi
PY - 2005/9/15
Y1 - 2005/9/15
N2 - We demonstrate, using x-ray diffraction, that we have taken one-dimensional Bi nanolines fabricated on a Si(001) surface, and buried them in crystalline silicon while retaining both their one-dimensional characters and important aspects of their structure. In particular, after burial, the nanolines retain the two-by periodicity associated with their surface structure along their length. We have used density functional theory calculations to model a structure for these buried nanolines, whose minimum length can be estimated to be 100 nm from the coherence length of the x-ray measurements.
AB - We demonstrate, using x-ray diffraction, that we have taken one-dimensional Bi nanolines fabricated on a Si(001) surface, and buried them in crystalline silicon while retaining both their one-dimensional characters and important aspects of their structure. In particular, after burial, the nanolines retain the two-by periodicity associated with their surface structure along their length. We have used density functional theory calculations to model a structure for these buried nanolines, whose minimum length can be estimated to be 100 nm from the coherence length of the x-ray measurements.
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U2 - 10.1103/PhysRevB.72.121407
DO - 10.1103/PhysRevB.72.121407
M3 - Article
AN - SCOPUS:29744454112
SN - 0163-1829
VL - 72
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 12
M1 - 121407
ER -