Energy dispersive X-ray diffraction (EDXD) facility for determining structure of high temperature melts with a stationary specimen goniometer

Susumu Takeda; Valery G. Petkov; Kazumasa Sugiyama; Yoshio Waseda

doi:10.2320/matertrans1989.34.410

Energy dispersive X-ray diffraction (EDXD) facility for determining structure of high temperature melts with a stationary specimen goniometer

Susumu Takeda, Valery G. Petkov, Kazumasa Sugiyama, Yoshio Waseda

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

A high temperature energy dispersive X-ray diffraction (EDXD) facility has been newly built using a vertical type goniometer, which make it possible to measure the diffraction profiles of melts from room temperature to 1873 K. The fundamentals of this facility were confirmed by obtaining the interference function of a silica glass sample over Q = 200 nm^-1 at room temperature using the computer program of PEDX for the generalized radial distribution function analysis of EDXD developed by the present authors (Petkov and Waseda). The feasibility for a high temperature melt was made by applying this EDXD facility to a structural study of liquid bismuth germanate (Bi₄Ge₃O₁₂) at 1373 K.

Original language	English
Pages (from-to)	410-414
Number of pages	5
Journal	Materials Transactions, JIM
Volume	34
Issue number	5
DOIs	https://doi.org/10.2320/matertrans1989.34.410
Publication status	Published - 1993
Externally published	Yes

ASJC Scopus subject areas

Engineering(all)

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10.2320/matertrans1989.34.410

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abstract = "A high temperature energy dispersive X-ray diffraction (EDXD) facility has been newly built using a vertical type goniometer, which make it possible to measure the diffraction profiles of melts from room temperature to 1873 K. The fundamentals of this facility were confirmed by obtaining the interference function of a silica glass sample over Q = 200 nm-1 at room temperature using the computer program of PEDX for the generalized radial distribution function analysis of EDXD developed by the present authors (Petkov and Waseda). The feasibility for a high temperature melt was made by applying this EDXD facility to a structural study of liquid bismuth germanate (Bi4Ge3O12) at 1373 K.",

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AU - Takeda, Susumu

AU - Petkov, Valery G.

AU - Sugiyama, Kazumasa

AU - Waseda, Yoshio

PY - 1993

Y1 - 1993

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AB - A high temperature energy dispersive X-ray diffraction (EDXD) facility has been newly built using a vertical type goniometer, which make it possible to measure the diffraction profiles of melts from room temperature to 1873 K. The fundamentals of this facility were confirmed by obtaining the interference function of a silica glass sample over Q = 200 nm-1 at room temperature using the computer program of PEDX for the generalized radial distribution function analysis of EDXD developed by the present authors (Petkov and Waseda). The feasibility for a high temperature melt was made by applying this EDXD facility to a structural study of liquid bismuth germanate (Bi4Ge3O12) at 1373 K.

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Energy dispersive X-ray diffraction (EDXD) facility for determining structure of high temperature melts with a stationary specimen goniometer

Abstract

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