Energy Dispersive X-ray Diffraction Method for Structural Characterization of Non-Crystalline Oxides

Yoshio Waseda; Kazumasa Sugiyama

doi:10.1515/HTMP.2003.22.3-4.211

Energy Dispersive X-ray Diffraction Method for Structural Characterization of Non-Crystalline Oxides

Yoshio Waseda, Kazumasa Sugiyama

Materials Development Division

Research output: Contribution to journal › Article › peer-review

Abstract

The fundamentals of the energy dispersive X-ray diffraction (EDXD) method for materials characterization have been described using the results of non-crystalline oxides. This relatively new method makes it possible to measure the diffraction profiles in the wide wave vector region over 200 nm_-1which is beyond the limit (usually 150 nm_-1) for conventional angular dispersive X-ray diffraction method. The validity and usefulness of the EDXD method were demonstrated by obtaining the well-resolved radial distribution functions of SiO₂glass at room temperature, NaAISi₃O₈melt at 1460 K and LiNbO₃melt at 1550 K.

Original language	English
Pages (from-to)	211-220
Number of pages	10
Journal	High Temperature Materials and Processes
Volume	22
Issue number	3-4
DOIs	https://doi.org/10.1515/HTMP.2003.22.3-4.211
Publication status	Published - 2003 Jan 1

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Physical and Theoretical Chemistry

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10.1515/HTMP.2003.22.3-4.211

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abstract = "The fundamentals of the energy dispersive X-ray diffraction (EDXD) method for materials characterization have been described using the results of non-crystalline oxides. This relatively new method makes it possible to measure the diffraction profiles in the wide wave vector region over 200 nm-1which is beyond the limit (usually 150 nm-1) for conventional angular dispersive X-ray diffraction method. The validity and usefulness of the EDXD method were demonstrated by obtaining the well-resolved radial distribution functions of SiO2glass at room temperature, NaAISi3O8melt at 1460 K and LiNbO3melt at 1550 K.",

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N2 - The fundamentals of the energy dispersive X-ray diffraction (EDXD) method for materials characterization have been described using the results of non-crystalline oxides. This relatively new method makes it possible to measure the diffraction profiles in the wide wave vector region over 200 nm-1which is beyond the limit (usually 150 nm-1) for conventional angular dispersive X-ray diffraction method. The validity and usefulness of the EDXD method were demonstrated by obtaining the well-resolved radial distribution functions of SiO2glass at room temperature, NaAISi3O8melt at 1460 K and LiNbO3melt at 1550 K.

AB - The fundamentals of the energy dispersive X-ray diffraction (EDXD) method for materials characterization have been described using the results of non-crystalline oxides. This relatively new method makes it possible to measure the diffraction profiles in the wide wave vector region over 200 nm-1which is beyond the limit (usually 150 nm-1) for conventional angular dispersive X-ray diffraction method. The validity and usefulness of the EDXD method were demonstrated by obtaining the well-resolved radial distribution functions of SiO2glass at room temperature, NaAISi3O8melt at 1460 K and LiNbO3melt at 1550 K.

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JO - High Temperature Materials and Processes

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ER -

Energy Dispersive X-ray Diffraction Method for Structural Characterization of Non-Crystalline Oxides

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