TY - JOUR
T1 - Energy-dispersive X-ray diffraction(EDXD) technique for structural studies of disordered materials. Application to SiO2, SrP2O6, Pd80Si20, Fe40Ni40P14B6 glasses and liquid Hg
AU - Sugiyama, K.
AU - Petkov, V. P.
AU - Takeda, A. S.
PY - 1997
Y1 - 1997
N2 - Structure factors in the wave vector Q region larger than 200 nm-1 and corresponding radial distribution functions with improved resolution for SiO2 and SrP2O6 oxide glasses, Pd80Si20 and Fe40Ni40P14B6 metallic glasses, and liquid Hg have been obtained by the energy dispersive X-ray diffraction (EDXD) method. Structure data obtained by the present study were compared with the previous wide-angle diffraction experiments of the same disordered materials and the reliability and usefulness of EDXD method were demonstrated.
AB - Structure factors in the wave vector Q region larger than 200 nm-1 and corresponding radial distribution functions with improved resolution for SiO2 and SrP2O6 oxide glasses, Pd80Si20 and Fe40Ni40P14B6 metallic glasses, and liquid Hg have been obtained by the energy dispersive X-ray diffraction (EDXD) method. Structure data obtained by the present study were compared with the previous wide-angle diffraction experiments of the same disordered materials and the reliability and usefulness of EDXD method were demonstrated.
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U2 - 10.1515/HTMP.1997.16.1.49
DO - 10.1515/HTMP.1997.16.1.49
M3 - Article
AN - SCOPUS:0030642964
SN - 0334-6455
VL - 16
SP - 49
EP - 56
JO - High Temperature Materials and Processes
JF - High Temperature Materials and Processes
IS - 1
ER -