Enhanced diffraction of MeV γ-rays by mosaic crystals

Shunya Matsuba, Takehito Hayakawa, Toshiyuki Shizuma, Nobuyuki Nishimori, Ryoji Nagai, Masaru Sawamura, Christopher T. Angell, Mamoru Fujiwara, Ryoichi Hajima

    Research output: Contribution to journalArticlepeer-review

    1 Citation (Scopus)


    The diffraction of γ-rays by mosaic Si crystals with thicknesses of 20, 40, and 80mm and by a 2-mm-thick perfect Si crystal in a transmission Laue geometry was measured using a high-flux 60Co source with an intensity of 2.2 TBq. The measured diffraction intensities at 1.17 and 1.33MeV using 40- and 80-mm-thick mosaic crystals were enhanced by a factor of approximately 8.6 compared with those of the perfect Si crystal. The integrated reflectivity is well described in statistical dynamical theory by taking into account γ-ray absorption inside the crystals.

    Original languageEnglish
    Article number112402
    JournalJapanese journal of applied physics
    Issue number11
    Publication statusPublished - 2016 Nov

    ASJC Scopus subject areas

    • Engineering(all)
    • Physics and Astronomy(all)


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