Abstract
We have used the Bi(0 0 0 1)/Si(1 1 1) template to grow highly ordered C60 epitaxial thin films and analyzed them using scanning tunneling microscopy and low-energy electron microscopy. The in situ low-energy electron microscope investigations show that the initial nucleation of the C60 islands on the surface takes place at surface defects, such as domain boundaries and multiple steps. The in-plane lattice parameters of this C60 film turns out to be the same as that of the bulk fcc(1 1 1) C60. The line-on-line epitaxial structure is realized in spite of a weak interaction between the C60 molecules and Bi(0 0 0 1) surface, while scanning tunneling spectroscopy indicates that there is a negligible charge transfer between the molecules and the surface.
Original language | English |
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Pages (from-to) | L136-L139 |
Journal | Surface Science |
Volume | 601 |
Issue number | 23 |
DOIs | |
Publication status | Published - 2007 Dec 1 |
Keywords
- Epitaxy
- Fullerenes
- Low energy electron diffraction (LEED)
- Low-energy electron microscopy (LEEM)
- Scanning tunneling microscopy
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry