Epitaxial growth of half-metallic ferromagnet 'zinc-blende CrAs' and the substrate temperature dependence was analyzed using reflection high-energy electron diffraction (RHEED) technique. The CrAs (2 nm) thin films were grown at 200°C and 300°C temperature. The film grown at 200°C formed plateau-shapes whereas CrAs (2 nm) grown at 300°C formed dispersed dots. It is found that the thin film grown at 200°C showed ferromagnetic behavior at room temperature while curie temperature is estimated to be over 400 K.
- Atomic force microscopy
- Molecular beam epitaxy