Erratum: A wide dynamic range CMOS image sensor with 200-1100nm spectral sensitivity and high robustness to UV right exposure (Japanese Journal of Applied Physics (2014) 53 (04EE07)

Satoshi Nasuno; Shun Kawada; Yasumasa Koda; Taiki Nakazawa; Katsuhiko Hanzawa; Rihito Kuroda; Shigetoshi Sugawa

doi:10.7567/JJAP.53.069204

Erratum: A wide dynamic range CMOS image sensor with 200-1100nm spectral sensitivity and high robustness to UV right exposure (Japanese Journal of Applied Physics (2014) 53 (04EE07)

Satoshi Nasuno, Shun Kawada, Yasumasa Koda, Taiki Nakazawa, Katsuhiko Hanzawa, Rihito Kuroda, Shigetoshi Sugawa

ENG - Management Science and Technology

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English
Article number	069204
Journal	Japanese journal of applied physics
Volume	53
Issue number	6
DOIs	https://doi.org/10.7567/JJAP.53.069204
Publication status	Published - 2014 Jun

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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10.7567/JJAP.53.069204

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Erratum: A wide dynamic range CMOS image sensor with 200-1100nm spectral sensitivity and high robustness to UV right exposure (Japanese Journal of Applied Physics (2014) 53 (04EE07). / Nasuno, Satoshi; Kawada, Shun; Koda, Yasumasa et al.
In: Japanese journal of applied physics, Vol. 53, No. 6, 069204, 06.2014.

Research output: Contribution to journal › Comment/debate › peer-review

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title = "Erratum: A wide dynamic range CMOS image sensor with 200-1100nm spectral sensitivity and high robustness to UV right exposure (Japanese Journal of Applied Physics (2014) 53 (04EE07)",

author = "Satoshi Nasuno and Shun Kawada and Yasumasa Koda and Taiki Nakazawa and Katsuhiko Hanzawa and Rihito Kuroda and Shigetoshi Sugawa",

year = "2014",

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AU - Hanzawa, Katsuhiko

AU - Kuroda, Rihito

AU - Sugawa, Shigetoshi

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JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

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Erratum: A wide dynamic range CMOS image sensor with 200-1100nm spectral sensitivity and high robustness to UV right exposure (Japanese Journal of Applied Physics (2014) 53 (04EE07)

ASJC Scopus subject areas

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