Erratum: Dislocation structure in AlN films induced by in situ transmission electron microscope nanoindentation (Journal of Applied Physics (2012) 112 (093526))

Yuki Tokumoto; Kentaro Kutsukake; Yutaka Ohno; Ichiro Yonenaga

doi:10.1063/1.4771927

Erratum: Dislocation structure in AlN films induced by in situ transmission electron microscope nanoindentation (Journal of Applied Physics (2012) 112 (093526))

Yuki Tokumoto, Kentaro Kutsukake, Yutaka Ohno, Ichiro Yonenaga

IMR - Institute for Materials Research (institute affiliation only)

Research output: Contribution to journal › Comment/debate

1 Citation (Scopus)

Original language	English
Article number	129902
Journal	Journal of Applied Physics
Volume	112
Issue number	12
DOIs	https://doi.org/10.1063/1.4771927
Publication status	Published - 2012 Dec 15

Access to Document

10.1063/1.4771927

Cite this

@article{a3d192442c5b432099b2c51a589a42f2,

title = "Erratum: Dislocation structure in AlN films induced by in situ transmission electron microscope nanoindentation (Journal of Applied Physics (2012) 112 (093526))",

author = "Yuki Tokumoto and Kentaro Kutsukake and Yutaka Ohno and Ichiro Yonenaga",

year = "2012",

month = dec,

day = "15",

doi = "10.1063/1.4771927",

language = "English",

volume = "112",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "12",

}

TY - JOUR

T1 - Erratum

T2 - Dislocation structure in AlN films induced by in situ transmission electron microscope nanoindentation (Journal of Applied Physics (2012) 112 (093526))

AU - Tokumoto, Yuki

AU - Kutsukake, Kentaro

AU - Ohno, Yutaka

AU - Yonenaga, Ichiro

PY - 2012/12/15

Y1 - 2012/12/15

UR - http://www.scopus.com/inward/record.url?scp=84886823262&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84886823262&partnerID=8YFLogxK

U2 - 10.1063/1.4771927

DO - 10.1063/1.4771927

M3 - Comment/debate

AN - SCOPUS:84886823262

SN - 0021-8979

VL - 112

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 12

M1 - 129902

ER -

Erratum: Dislocation structure in AlN films induced by in situ transmission electron microscope nanoindentation (Journal of Applied Physics (2012) 112 (093526))

Access to Document

Other files and links

Cite this