Erratum: Two-dimensional approach to fluorescence yield XANES measurement using a silicon drift detector (Journal of Synchrotron Radiation 18 (747-752))

Y. Tamenori, M. Morita, T. Nakamura

Research output: Contribution to journalComment/debatepeer-review

Original languageEnglish
Pages (from-to)944
Number of pages1
JournalJournal of Synchrotron Radiation
Issue number6
Publication statusPublished - 2011 Nov
Externally publishedYes

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

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