Error probability of MRC in frequency selective Nakagami fading in the presence of CCI and ACI

Mohammad Azizur Rahman, Chin Sean Sum, Ryuhei Funada, Shigenobu Sasaki, Tuncer Baykas, Junyi Wang, Hiroshi Harada, Shuzo Kato

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


An exact expression of error rate is developed for maximal ratio combining (MRC) in an independent but not necessarily identically distributed frequency selective Nakagami fading channel taking into account inter-symbol, co-channel and adjacent channel interferences (ISI, CCI and ACI respectively). The characteristic function (CF) method is adopted. While accurate analysis of MRC performance cannot be seen in frequency selective channel taking ISI (and CCI) into account, such analysis for ACI has not been addressed yet. The general analysis presented in this paper solves a problem of past and present interest, which has so far been studied either approximately or in simulations. The exact method presented also lets us obtain an approximate error rate expression based on Gaussian approximation (GA) of the interferences. It is shown, especially while the channel is lightly faded, has fewer multipath components and a decaying delay profile, the GA may be substantially inaccurate at high signal-to-noise ratio. However, the exact results also reveal an important finding that there is a range of parameters where the simpler GA is reasonably accurate and hence, we don't have to go for more involved exact expression.

Original languageEnglish
Pages (from-to)2679-2687
Number of pages9
JournalIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Issue number11
Publication statusPublished - 2009 Nov


  • Adjacent channel interference (ACI)
  • Co-channel interference (CCI)
  • Frequency selective Nakagami fading
  • Inter-symbol interference (ISI)
  • Maximal ratio combining (MRC)

ASJC Scopus subject areas

  • Signal Processing
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering
  • Applied Mathematics


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