TY - JOUR
T1 - Estimation of peak frequency of loss in noise suppressor using demagnetizing factor
AU - Muroga, Sho
AU - Endo, Yasushi
AU - Mitsuzuka, Yoshio
AU - Shimada, Yutaka
AU - Yamaguchi, Masahiro
N1 - Funding Information:
ACKNOWLEDGMENT The authors thank Y. Shimada for thoughtful discussions. The authors thank N. Sato for performing the initial permeability measurements. This work was supported in part by the Strategic Information and Communications R&D Promotion Programme (SCOPE) of the Ministry of Internal Affairs, Japan. This work was also supported in part by R&D Center of Excellence for Integrated Microsystems, Tohoku University. The VLSI chip in this study was fabricated in the chip fabrication program of the VLSI Design and Education Center (VDEC) at the University of Tokyo in collaboration with Oki Electric Industry Co., Ltd.
PY - 2011/2
Y1 - 2011/2
N2 - This study analyzes the loss peak frequency of an integrated ferromagnetic noise suppressor by evaluating the demagnetizing field. An integrated ferromagnetic noise suppressor is fabricated using a regular silicon process, and relation between the loss peak frequency and demagnetizing field is evaluated. The demagnetizing factor is calculated by approximating the magnetic film by a slender ellipsoid. Measurements of a fabricated on-chip noise suppressor reveal that the loss is maximized at 7 GHz, which is equal to the calculated ferromagnetic resonance (FMR) frequency. Then, the relation between the loss peak frequency and FMR frequency are discussed with some magnetic films in our previous works. The loss peak frequencies in coplanar lines of various magnetic films with different ratios of the film thickness to the signal line width agree well with the FMR frequency of magnetic films. This result reveals that the shift of the loss peak depends on the demagnetizing field over a wide frequency range. Consequently, the loss peak frequency of the integrated ferromagnetic noise suppressor can be controlled as a function of demagnetizing field in the magnetic film.
AB - This study analyzes the loss peak frequency of an integrated ferromagnetic noise suppressor by evaluating the demagnetizing field. An integrated ferromagnetic noise suppressor is fabricated using a regular silicon process, and relation between the loss peak frequency and demagnetizing field is evaluated. The demagnetizing factor is calculated by approximating the magnetic film by a slender ellipsoid. Measurements of a fabricated on-chip noise suppressor reveal that the loss is maximized at 7 GHz, which is equal to the calculated ferromagnetic resonance (FMR) frequency. Then, the relation between the loss peak frequency and FMR frequency are discussed with some magnetic films in our previous works. The loss peak frequencies in coplanar lines of various magnetic films with different ratios of the film thickness to the signal line width agree well with the FMR frequency of magnetic films. This result reveals that the shift of the loss peak depends on the demagnetizing field over a wide frequency range. Consequently, the loss peak frequency of the integrated ferromagnetic noise suppressor can be controlled as a function of demagnetizing field in the magnetic film.
KW - Demagnetizing field
KW - Electromagnetic compatibility
KW - Electromagnetic noise suppressor
KW - Ferromagnetic resonance frequency
KW - Ferromagnetic resonance loss
KW - Magnetic films
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U2 - 10.1109/TMAG.2010.2082511
DO - 10.1109/TMAG.2010.2082511
M3 - Article
AN - SCOPUS:79251498621
SN - 0018-9464
VL - 47
SP - 300
EP - 303
JO - IEEE Transactions on Magnetics
JF - IEEE Transactions on Magnetics
IS - 2 PART 1
M1 - 5697347
ER -