Evaluation of bit error rate for ferroelectric data storage

Bit data was recorded on a LiTaO₃ single-crystal medium using a data storage system which was based on scanning nonlinear dielectric microscopy, and bit error rate was evaluated. The recording medium with a highly homogeneous thickness of 119 nm was prepared employing both polarization controlled wet etching and dry etching techniques. A 256 × 256 data bit array was recorded at an areal density of 258 Gbit/inch². The bit error rate was determined to be 1.2 × 10^-3 by visual inspection. An automated analysis method was subsequently discussed in detail.