TY - JOUR
T1 - Evaluation of interface resistance in a rebco tape at different temperatures by contact-probing current transfer length method
AU - Hayasaka, Ryoichiro
AU - Ito, Satoshi
AU - Hashizume, Hidetoshi
N1 - Funding Information:
Manuscript received October 29, 2018; accepted January 23, 2019. Date of publication January 28, 2019; date of current version February 6, 2019. This work was supported by the Japan Society for the Promotion of Science (JSPS) Grant-in-Aid for Scientific Research (S) under Grant 26220913. (Corresponding author: Ryoichiro Hayasaka.) The authors are with the Department of Quantum Science and Energy Engineering, Graduate School of Engineering, Tohoku University, Sendai 980-8577, Japan (e-mail:,ryoichiro.hayasaka.p5@dc.tohoku.ac.jp).
Publisher Copyright:
© 2002-2011 IEEE.
PY - 2019/8
Y1 - 2019/8
N2 - The multi-layered structure of a rare-earth barium copper oxide (REBCO) tape causes the resistance of Cu/Ag and Ag/REBCO interfaces (interface resistance), which is a major factor of the resistance of tape-to-tape joints (joint resistance). Interface resistance has been evaluated by the current transfer length (CTL) method. However, induced damage of a part of the measured REBCO tape in this method may cause variations in estimated values, as well as making the tape itself unable to be reused for applications. Therefore, this study proposes the contact-probing CTL method, which is a nondestructive evaluation method of interface resistance. We evaluated the interface resistance in a REBCO tape by the conventional CTL method and the contact-probing CTL method. The estimated interface resistance values by the contact-probing CTL method were more reliable and less varied than those by the conventional method. We also evaluated the temperature dependence of the interface resistance, which is important to analyze joint resistance for various applications of REBCO tapes. The result showed that the interface resistance remained constant at different temperatures.
AB - The multi-layered structure of a rare-earth barium copper oxide (REBCO) tape causes the resistance of Cu/Ag and Ag/REBCO interfaces (interface resistance), which is a major factor of the resistance of tape-to-tape joints (joint resistance). Interface resistance has been evaluated by the current transfer length (CTL) method. However, induced damage of a part of the measured REBCO tape in this method may cause variations in estimated values, as well as making the tape itself unable to be reused for applications. Therefore, this study proposes the contact-probing CTL method, which is a nondestructive evaluation method of interface resistance. We evaluated the interface resistance in a REBCO tape by the conventional CTL method and the contact-probing CTL method. The estimated interface resistance values by the contact-probing CTL method were more reliable and less varied than those by the conventional method. We also evaluated the temperature dependence of the interface resistance, which is important to analyze joint resistance for various applications of REBCO tapes. The result showed that the interface resistance remained constant at different temperatures.
KW - Current transfer
KW - Interface resistance
KW - Rebco tape
KW - Tape-to-tape joints
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U2 - 10.1109/TASC.2019.2895603
DO - 10.1109/TASC.2019.2895603
M3 - Article
AN - SCOPUS:85060247961
SN - 1051-8223
VL - 29
JO - IEEE Transactions on Applied Superconductivity
JF - IEEE Transactions on Applied Superconductivity
IS - 5
M1 - 8627933
ER -