TY - JOUR
T1 - Evaluation of junction parameters with control of carrier concentration in Bi2Sr2CaCu2O 8+δ stacked junctions
AU - Inomata, K.
AU - Sato, S.
AU - Nakajima, K.
AU - Kim, S. J.
AU - Hatano, T.
AU - Takano, Y.
AU - Nagao, M.
AU - Yamashita, T.
PY - 2004/10
Y1 - 2004/10
N2 - The control of the critical current density (JC) and the junction resistance (RN) along the c axis of intrinsic Josephson junctions (IJJs) on a high-TC superconductor is very important for applying the IJJs to electronic devices. For controlling these junction parameters, we have clarified the relationship of JC, RN, and the carrier concentration in Bi2Sr2CaCu 2O8+δ whiskers by changing the carrier concentration with an annealing process. We determined the electrical transport characteristics of the IJJs. As a result, the JC increased, and the RN decreased systematically when the carrier concentration increased. The values of JC and RN could be controlled by a change in the carrier concentration.
AB - The control of the critical current density (JC) and the junction resistance (RN) along the c axis of intrinsic Josephson junctions (IJJs) on a high-TC superconductor is very important for applying the IJJs to electronic devices. For controlling these junction parameters, we have clarified the relationship of JC, RN, and the carrier concentration in Bi2Sr2CaCu 2O8+δ whiskers by changing the carrier concentration with an annealing process. We determined the electrical transport characteristics of the IJJs. As a result, the JC increased, and the RN decreased systematically when the carrier concentration increased. The values of JC and RN could be controlled by a change in the carrier concentration.
KW - Carrier concentration
KW - Intrinsic Josephson junctions
KW - Whisker
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U2 - 10.1016/j.physc.2003.12.102
DO - 10.1016/j.physc.2003.12.102
M3 - Article
AN - SCOPUS:4644226721
SN - 0921-4534
VL - 412-414
SP - 1396
EP - 1400
JO - Physica C: Superconductivity and its Applications
JF - Physica C: Superconductivity and its Applications
IS - SPEC. ISS.
ER -