Evaluation of spatial and temporal resolution on in situ annealing aberration-corrected transmission electron microscopy with proportional-integral-differential controller

Yusuke Shimada; Kenta Yoshida; Koji Inoue; Takahisa Shiraishi; Takanori Kiguchi; Yasuyoshi Nagai; Toyohiko J. Konno

doi:10.1093/jmicro/dfz010

Evaluation of spatial and temporal resolution on in situ annealing aberration-corrected transmission electron microscopy with proportional-integral-differential controller

Yusuke Shimada, Kenta Yoshida, Koji Inoue, Takahisa Shiraishi, Takanori Kiguchi, Yasuyoshi Nagai, Toyohiko J. Konno

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

The in situ annealing observation in transmission electron microscope (TEM) is one of the effective methods for imaging thermally induced microstructural changes. For applying this dynamical characterization to bulk samples fabricated by ion-milling, electropolishing or focused ion beam (FIB) mill, it is generally needed to use a heating-pot type system. We here report an initial trial to improve the spatial and temporal resolution during the in-situ annealing observation of bulk samples using a spherical aberration corrected (AC) TEM with a new thermal control unit. The information limit of 1.5Å and the point resolution of 2.0Å are achieved under isothermal annealing at 350°C, which is the same resolution at room temperature, and it is affected strongly of sample drift by the temperature variation. The sample is heated at a heating rate of +1.0°C/s, the drift distance observed by a TV readout speed CCD camera is less than 2.0 Å/s.

Original language	English
Pages (from-to)	271-278
Number of pages	8
Journal	Microscopy
Volume	68
Issue number	3
DOIs	https://doi.org/10.1093/jmicro/dfz010
Publication status	Published - 2019 Jun 1

Keywords

AC-TEM
HRTEM
annealing
atomic resolution
in situ heating

ASJC Scopus subject areas

Structural Biology
Instrumentation
Radiology Nuclear Medicine and imaging

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10.1093/jmicro/dfz010

Cite this

@article{3b961b057d8b408da012e6f22a295f95,

title = "Evaluation of spatial and temporal resolution on in situ annealing aberration-corrected transmission electron microscopy with proportional-integral-differential controller",

abstract = "The in situ annealing observation in transmission electron microscope (TEM) is one of the effective methods for imaging thermally induced microstructural changes. For applying this dynamical characterization to bulk samples fabricated by ion-milling, electropolishing or focused ion beam (FIB) mill, it is generally needed to use a heating-pot type system. We here report an initial trial to improve the spatial and temporal resolution during the in-situ annealing observation of bulk samples using a spherical aberration corrected (AC) TEM with a new thermal control unit. The information limit of 1.5{\AA} and the point resolution of 2.0{\AA} are achieved under isothermal annealing at 350°C, which is the same resolution at room temperature, and it is affected strongly of sample drift by the temperature variation. The sample is heated at a heating rate of +1.0°C/s, the drift distance observed by a TV readout speed CCD camera is less than 2.0 {\AA}/s.",

keywords = "AC-TEM, HRTEM, annealing, atomic resolution, in situ heating",

author = "Yusuke Shimada and Kenta Yoshida and Koji Inoue and Takahisa Shiraishi and Takanori Kiguchi and Yasuyoshi Nagai and Konno, {Toyohiko J.}",

note = "Funding Information: This work was partly supported by a Grant-in-Aid for Young Scientists (A) (16H05966), Grant-in-Aid for Young Scientists (B) (16K18254) and, Grants-in-Aid for Scientific Research foundation (16H02446) from the Japan Society for the Promotion of Science (JSPS) Japan. Publisher Copyright: {\textcopyright} 2019 The Author(s).",

year = "2019",

month = jun,

day = "1",

doi = "10.1093/jmicro/dfz010",

language = "English",

volume = "68",

pages = "271--278",

journal = "Microscopy (Oxford, England)",

issn = "2050-5698",

publisher = "Japanese Society of Microscopy",

number = "3",

}

TY - JOUR

T1 - Evaluation of spatial and temporal resolution on in situ annealing aberration-corrected transmission electron microscopy with proportional-integral-differential controller

AU - Shimada, Yusuke

AU - Yoshida, Kenta

AU - Inoue, Koji

AU - Shiraishi, Takahisa

AU - Kiguchi, Takanori

AU - Nagai, Yasuyoshi

AU - Konno, Toyohiko J.

N1 - Funding Information: This work was partly supported by a Grant-in-Aid for Young Scientists (A) (16H05966), Grant-in-Aid for Young Scientists (B) (16K18254) and, Grants-in-Aid for Scientific Research foundation (16H02446) from the Japan Society for the Promotion of Science (JSPS) Japan. Publisher Copyright: © 2019 The Author(s).

PY - 2019/6/1

Y1 - 2019/6/1

N2 - The in situ annealing observation in transmission electron microscope (TEM) is one of the effective methods for imaging thermally induced microstructural changes. For applying this dynamical characterization to bulk samples fabricated by ion-milling, electropolishing or focused ion beam (FIB) mill, it is generally needed to use a heating-pot type system. We here report an initial trial to improve the spatial and temporal resolution during the in-situ annealing observation of bulk samples using a spherical aberration corrected (AC) TEM with a new thermal control unit. The information limit of 1.5Å and the point resolution of 2.0Å are achieved under isothermal annealing at 350°C, which is the same resolution at room temperature, and it is affected strongly of sample drift by the temperature variation. The sample is heated at a heating rate of +1.0°C/s, the drift distance observed by a TV readout speed CCD camera is less than 2.0 Å/s.

AB - The in situ annealing observation in transmission electron microscope (TEM) is one of the effective methods for imaging thermally induced microstructural changes. For applying this dynamical characterization to bulk samples fabricated by ion-milling, electropolishing or focused ion beam (FIB) mill, it is generally needed to use a heating-pot type system. We here report an initial trial to improve the spatial and temporal resolution during the in-situ annealing observation of bulk samples using a spherical aberration corrected (AC) TEM with a new thermal control unit. The information limit of 1.5Å and the point resolution of 2.0Å are achieved under isothermal annealing at 350°C, which is the same resolution at room temperature, and it is affected strongly of sample drift by the temperature variation. The sample is heated at a heating rate of +1.0°C/s, the drift distance observed by a TV readout speed CCD camera is less than 2.0 Å/s.

KW - AC-TEM

KW - HRTEM

KW - annealing

KW - atomic resolution

KW - in situ heating

UR - http://www.scopus.com/inward/record.url?scp=85067204140&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85067204140&partnerID=8YFLogxK

U2 - 10.1093/jmicro/dfz010

DO - 10.1093/jmicro/dfz010

M3 - Article

C2 - 30843044

AN - SCOPUS:85067204140

SN - 2050-5698

VL - 68

SP - 271

EP - 278

JO - Microscopy (Oxford, England)

JF - Microscopy (Oxford, England)

IS - 3

ER -

Evaluation of spatial and temporal resolution on in situ annealing aberration-corrected transmission electron microscopy with proportional-integral-differential controller

Abstract

Keywords

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