Evaluation of strain field around SiC particle in poly-crystalline silicon

T. Ujihara, T. Ichitsubo, N. Usami, K. Nakajima, Y. Takeda

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Cast poly-crystalline silicon is unexpectedly contaminated with a large amount of oxygen and carbon impurities. However, the effect of carbon impurity is ambiguity. Recently, we made clear carbon impurity is locally super-saturated near grain boundaries. This local super-saturation can induce the precipitation of SiC particle. In this study, we investigated the influence of SiC particle to solar cell property, especially focusing the effect of the band-gap shrinkage induced by strain field in silicon caused by SiC precipitates. The strain field was directly observed by micro-Raman spectroscopy. Moreover, the strain field could be reproduced by calculation based on Eshelby's theory assuming strain is mainly due to the difference of thermal expansion. The strain was 0.1-0.2 % by experiments and 0.03-0.07 % by the calculations. The compressive or tensile strain of 0.03-0.2 % decreases the band-gap by 25-36 meV, which is equivalent to the thermal excitation energy at room temperature. This band-gap shrinkage is too small to capture carriers.

Original languageEnglish
Title of host publicationConference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4
PublisherIEEE Computer Society
Pages1064-1066
Number of pages3
ISBN (Print)1424400163, 9781424400164
DOIs
Publication statusPublished - 2006
Event2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4 - Waikoloa, HI, United States
Duration: 2006 May 72006 May 12

Publication series

NameConference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4
Volume1

Conference

Conference2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4
Country/TerritoryUnited States
CityWaikoloa, HI
Period06/5/706/5/12

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