Evidence of rhombohedral structure within BiFeO3 thin film grown on SrTiO3

In Tae Bae, Hiroshi Naganuma

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11 Citations (Scopus)


Comprehensive crystal structure analysis was performed for a BiFeO3 thin layer (∼30 nm) grown on a SrTiO3 substrate using cross-sectional transmission electron microscopy along three different zone axes. Nano-beam electron diffraction patterns combined with structure factor calculations and high-resolution transmission electron microscopy images unambiguously revealed that the BiFeO3 thin layer grew with a rhombohedral structure identical to its bulk form. No evidence of monoclinic and/or tetragonal distortion was found. The rhombohedral BiFeO3 thin layer was found to grow onto SrTiO3 by maintaining an epitaxial relationship in a manner minimizing the lattice mismatch at the BiFeO3/SrTiO3interface.

Original languageEnglish
Article number031501
JournalApplied Physics Express
Issue number3
Publication statusPublished - 2015 Mar 1


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