Exciton-exciton scattering in poly(di-n-hexylsilane) films

Makoto Shimizu, Shozo Suto, Aishi Yamamoto, Takenari Goto, Kasuya Atsuo Kasuya, Akira Watanabe, Minoru Matsuda

Research output: Contribution to journalConference articlepeer-review

6 Citations (Scopus)

Abstract

We have measured the time response of luminescence intensity in poly(di-n-hexylsilane) films with the excitation density from 1.2 × 1018 to 1.1 × 1020 excitons cm-3 at 2 K. At 1.1 × 1020 cm-3, we found that the rise times is 1.4 ± 0.5 ps and that the decay is nonexponential. The rise time is attributed to the exciton-exciton scattering time in which initially photo-generated excitons at 4 eV are scattered to the luminescent states at 3.4 eV. The nonexponential decay is ascribed to the bimolecular annihilation of excitons with the rate constant γ2 of (1.0 ± 0.5) × 10-8 cm3 s-1. A microscopic mechanism to explain this large γ2 is discussed.

Original languageEnglish
Pages (from-to)933-935
Number of pages3
JournalJournal of Luminescence
Volume87
DOIs
Publication statusPublished - 2000 May
EventInternational Conference on Luminescence and Optical Spectroscopy of Condensed Matter (ICL'99) - Osaka, Jpn
Duration: 1999 Aug 231999 Aug 27

Fingerprint

Dive into the research topics of 'Exciton-exciton scattering in poly(di-n-hexylsilane) films'. Together they form a unique fingerprint.

Cite this