Experimental research on the feature of an x-ray Talbot-Lau interferometer versus tube accelerating voltage

Sheng Hao Wang, Margie P. Olbinado, Atsushi Momose, Hua Jie Han, Ren Fang Hu, Zhi Li Wang, Kun Gao, Kai Zhang, Pei Ping Zhu, Zi Yu Wu

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)


X-ray Talbot-Lau interferometer has been used most widely to perform x-ray phase-contrast imaging with a conventional low-brilliance x-ray source, and it yields high-sensitivity phase and dark-field images of samples producing low absorption contrast, thus bearing tremendous potential for future clinical diagnosis. In this work, by changing the accelerating voltage of the x-ray tube from 35 kV to 45 kV, x-ray phase-contrast imaging of a test sample is performed at each integer value of the accelerating voltage to investigate the characteristic of an x-ray Talbot-Lau interferometer (located in the Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Japan) versus tube voltage. Experimental results and data analysis show that within a range this x-ray Talbot-Lau interferometer is not sensitive to the accelerating voltage of the tube with a constant fringe visibility of ∼ 44%. This x-ray Talbot-Lau interferometer research demonstrates the feasibility of a new dual energy phase-contrast x-ray imaging strategy and the possibility to collect a refraction spectrum.

Original languageEnglish
Article number068703
JournalChinese Physics B
Issue number6
Publication statusPublished - 2015 Jun 1


  • phase-contrast
  • tube accelerating voltage
  • x-ray Talbot-Lau interferometer
  • x-ray imaging
  • x-ray tube


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