Eyeglasses-type retinal imaging system using MEMS scanner

T. Sasaki; T. Nakazawa; K. Hane

doi:10.1109/NANO.2016.7751503

Eyeglasses-type retinal imaging system using MEMS scanner

T. Sasaki, T. Nakazawa, K. Hane

Tohoku University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We propose an eyeglasses-type retinal imaging system using MEMS scanner. The laser scanning confocal measurement system is incorporated in the glasses frame. The two dimensional electromagnetic MEMS scanner is used. The obtained image of the fundus of model eye using the instrument is also presented.

Original language	English
Title of host publication	16th International Conference on Nanotechnology - IEEE NANO 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	923-924
Number of pages	2
ISBN (Electronic)	9781509039142
DOIs	https://doi.org/10.1109/NANO.2016.7751503
Publication status	Published - 2016 Nov 21
Event	16th IEEE International Conference on Nanotechnology - IEEE NANO 2016 - Sendai, Japan Duration: 2016 Aug 22 → 2016 Aug 25

Publication series

Name	16th International Conference on Nanotechnology - IEEE NANO 2016

Conference

Conference	16th IEEE International Conference on Nanotechnology - IEEE NANO 2016
Country/Territory	Japan
City	Sendai
Period	16/8/22 → 16/8/25

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10.1109/NANO.2016.7751503

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title = "Eyeglasses-type retinal imaging system using MEMS scanner",

abstract = "We propose an eyeglasses-type retinal imaging system using MEMS scanner. The laser scanning confocal measurement system is incorporated in the glasses frame. The two dimensional electromagnetic MEMS scanner is used. The obtained image of the fundus of model eye using the instrument is also presented.",

author = "T. Sasaki and T. Nakazawa and K. Hane",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 16th IEEE International Conference on Nanotechnology - IEEE NANO 2016 ; Conference date: 22-08-2016 Through 25-08-2016",

year = "2016",

month = nov,

day = "21",

doi = "10.1109/NANO.2016.7751503",

language = "English",

series = "16th International Conference on Nanotechnology - IEEE NANO 2016",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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}

Sasaki, T, Nakazawa, T & Hane, K 2016, Eyeglasses-type retinal imaging system using MEMS scanner. in 16th International Conference on Nanotechnology - IEEE NANO 2016., 7751503, 16th International Conference on Nanotechnology - IEEE NANO 2016, Institute of Electrical and Electronics Engineers Inc., pp. 923-924, 16th IEEE International Conference on Nanotechnology - IEEE NANO 2016, Sendai, Japan, 16/8/22. https://doi.org/10.1109/NANO.2016.7751503

Eyeglasses-type retinal imaging system using MEMS scanner. / Sasaki, T.; Nakazawa, T.; Hane, K.
16th International Conference on Nanotechnology - IEEE NANO 2016. Institute of Electrical and Electronics Engineers Inc., 2016. p. 923-924 7751503 (16th International Conference on Nanotechnology - IEEE NANO 2016).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Eyeglasses-type retinal imaging system using MEMS scanner

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AU - Hane, K.

PY - 2016/11/21

Y1 - 2016/11/21

N2 - We propose an eyeglasses-type retinal imaging system using MEMS scanner. The laser scanning confocal measurement system is incorporated in the glasses frame. The two dimensional electromagnetic MEMS scanner is used. The obtained image of the fundus of model eye using the instrument is also presented.

AB - We propose an eyeglasses-type retinal imaging system using MEMS scanner. The laser scanning confocal measurement system is incorporated in the glasses frame. The two dimensional electromagnetic MEMS scanner is used. The obtained image of the fundus of model eye using the instrument is also presented.

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BT - 16th International Conference on Nanotechnology - IEEE NANO 2016

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T2 - 16th IEEE International Conference on Nanotechnology - IEEE NANO 2016

Y2 - 22 August 2016 through 25 August 2016

ER -

Eyeglasses-type retinal imaging system using MEMS scanner

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