Fabrication and characterization of (111)-epitaxial Pb(Zr0.35Ti0.65)O3/Pb(Zr0.65Ti0.35)O3 artificial superlattice thin films

Tomoaki Yamada; Youhei Ebihara; Takanori Kiguchi; Osami Sakata; Hitoshi Morioka; Takao Shimizu; Hiroshi Funakubo; Toyohiko J. Konno; Masahito Yoshino; Takanori Nagasaki

doi:10.7567/JJAP.55.10TA20

Fabrication and characterization of (111)-epitaxial Pb(Zr0.35Ti0.65)O3/Pb(Zr0.65Ti0.35)O3 artificial superlattice thin films

Tomoaki Yamada, Youhei Ebihara, Takanori Kiguchi, Osami Sakata, Hitoshi Morioka, Takao Shimizu, Hiroshi Funakubo, Toyohiko J. Konno, Masahito Yoshino, Takanori Nagasaki

IMR - Institute for Materials Research (institute affiliation only)

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Artificial superlattice thin films consisting of two different compositions of Pb(Zr,Ti)O₃ (PZT), which are in tetragonal and rhombohedral phases at room temperature in the bulk state, were grown on (111)_cSrRuO₃/(111)SrTiO₃ by pulsed laser deposition. Fairly perfect periodicity with sharp interfaces was observed by X-ray diffraction and scanning transmission electron microscopy. It was found that the film with each layer of 5 nm thickness had a single-domain structure for both PZT layers, which would arise from the strong mechanical and electrical coupling between PZT layers. The fabricated superlattice thin films showed saturated P-E hysteresis curves. Larger electromechanical response was observed in the films with smaller layer thickness.

Original language	English
Article number	10TA20
Journal	Japanese Journal of Applied Physics
Volume	55
Issue number	10
DOIs	https://doi.org/10.7567/JJAP.55.10TA20
Publication status	Published - 2016 Oct

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title = "Fabrication and characterization of (111)-epitaxial Pb(Zr0.35Ti0.65)O3/Pb(Zr0.65Ti0.35)O3 artificial superlattice thin films",

abstract = "Artificial superlattice thin films consisting of two different compositions of Pb(Zr,Ti)O3 (PZT), which are in tetragonal and rhombohedral phases at room temperature in the bulk state, were grown on (111)cSrRuO3/(111)SrTiO3 by pulsed laser deposition. Fairly perfect periodicity with sharp interfaces was observed by X-ray diffraction and scanning transmission electron microscopy. It was found that the film with each layer of 5 nm thickness had a single-domain structure for both PZT layers, which would arise from the strong mechanical and electrical coupling between PZT layers. The fabricated superlattice thin films showed saturated P-E hysteresis curves. Larger electromechanical response was observed in the films with smaller layer thickness.",

author = "Tomoaki Yamada and Youhei Ebihara and Takanori Kiguchi and Osami Sakata and Hitoshi Morioka and Takao Shimizu and Hiroshi Funakubo and Konno, {Toyohiko J.} and Masahito Yoshino and Takanori Nagasaki",

note = "Publisher Copyright: {\textcopyright} 2016 The Japan Society of Applied Physics.",

year = "2016",

month = oct,

doi = "10.7567/JJAP.55.10TA20",

language = "English",

volume = "55",

journal = "Japanese Journal of Applied Physics",

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T1 - Fabrication and characterization of (111)-epitaxial Pb(Zr0.35Ti0.65)O3/Pb(Zr0.65Ti0.35)O3 artificial superlattice thin films

AU - Yamada, Tomoaki

AU - Ebihara, Youhei

AU - Kiguchi, Takanori

AU - Sakata, Osami

AU - Morioka, Hitoshi

AU - Shimizu, Takao

AU - Funakubo, Hiroshi

AU - Konno, Toyohiko J.

AU - Yoshino, Masahito

AU - Nagasaki, Takanori

PY - 2016/10

Y1 - 2016/10

N2 - Artificial superlattice thin films consisting of two different compositions of Pb(Zr,Ti)O3 (PZT), which are in tetragonal and rhombohedral phases at room temperature in the bulk state, were grown on (111)cSrRuO3/(111)SrTiO3 by pulsed laser deposition. Fairly perfect periodicity with sharp interfaces was observed by X-ray diffraction and scanning transmission electron microscopy. It was found that the film with each layer of 5 nm thickness had a single-domain structure for both PZT layers, which would arise from the strong mechanical and electrical coupling between PZT layers. The fabricated superlattice thin films showed saturated P-E hysteresis curves. Larger electromechanical response was observed in the films with smaller layer thickness.

AB - Artificial superlattice thin films consisting of two different compositions of Pb(Zr,Ti)O3 (PZT), which are in tetragonal and rhombohedral phases at room temperature in the bulk state, were grown on (111)cSrRuO3/(111)SrTiO3 by pulsed laser deposition. Fairly perfect periodicity with sharp interfaces was observed by X-ray diffraction and scanning transmission electron microscopy. It was found that the film with each layer of 5 nm thickness had a single-domain structure for both PZT layers, which would arise from the strong mechanical and electrical coupling between PZT layers. The fabricated superlattice thin films showed saturated P-E hysteresis curves. Larger electromechanical response was observed in the films with smaller layer thickness.

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Fabrication and characterization of (111)-epitaxial Pb(Zr0.35Ti0.65)O3/Pb(Zr0.65Ti0.35)O3 artificial superlattice thin films

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