Abstract
The stacked magnetic tunnel junctions (MTJs) are microfabricated into ferromagnetic single-electron tunneling devices (F-SETs) by using electron-beam lithography. The F-SETs have a couple of small MTJs (30×500 nm2 -0.1×100 μ m2), which are connected via a metallic nanowire. The large tunnel magnetoresistance ratio as much as 40% (at RT) and small junction area dependence of the RA (resistance×area) are obtained. The electrostatic energy of F-SETs estimated from the minimum junction area corresponds to the temperature of 1 K, which is high enough to observe Coulomb blockade phenomena in a dilution refrigerator.
Original language | English |
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Article number | 10C909 |
Journal | Journal of Applied Physics |
Volume | 97 |
Issue number | 10 |
DOIs | |
Publication status | Published - 2005 May 15 |