Abstract
Perovskite-type oxides SrMO 3 (M:Ce and Zr) thin films and SrCeO 3 /SrZrO 3 superlattices have been made by ArF excimer laser ablation method. These materials incorporate a large amount of protons and are well known as proton conducting solid electrolytes. The scanning electron microscope observations reveal that thin films with smooth surface can be grown on (110) surface of MgO substrates. In contrast, only polycrystalline thin films can be grown on (100) surface of MgO substrates, which has been often used for the dielectric film growth. This result would be attributed to the large distortion of crystal structures of these materials from the ideal perovskite. From the result of Raman spectra and the electric conductivity measured on SrZrO 3 thin films, we found that the concentration of oxygen vacancies decrease with annealing in H 2 O-vapor atmosphere.
Original language | English |
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Pages (from-to) | 222-226 |
Number of pages | 5 |
Journal | Applied Surface Science |
Volume | 113-114 |
DOIs | |
Publication status | Published - 1997 Apr |
Keywords
- Laser ablation
- Perovskite oxides
- Proton
- Superlattices
- Thin films
ASJC Scopus subject areas
- Chemistry(all)
- Condensed Matter Physics
- Physics and Astronomy(all)
- Surfaces and Interfaces
- Surfaces, Coatings and Films