Abstract
Comparison of the resonance frequency of surface acoustic wave (SAW) resonators fabricated on defect-free and highly defective lithium tetraborate wafers was attempted. The intrinsic variation of SAW velocity due to crystal defects, impurities and chemical compositional inhomogeneities for lithium tetraborate wafers is smaller than ±0.011%. In addition, the variation of SAW velocity in a wafer is influenced by the device fabrication process rather than the lithium tetraborate substrate quality.
Original language | English |
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Pages (from-to) | 3074-3075 |
Number of pages | 2 |
Journal | Japanese Journal of Applied Physics |
Volume | 36 |
Issue number | 5 SUPPL. B |
DOIs | |
Publication status | Published - 1997 May |
Keywords
- Crystalline defects
- Impurity
- Lithium tetraborate
- SAW resonator
- SAW velocity