Abstract
A maximum high voltage of 5 kV was applied to a Grimm glow-discharge lamp using helium gas. The characteristic X-rays and continuous X-rays were measured from an X-ray window attached to the lamp, indicating the existence of fast electrons which could excite X-rays. The electrons emitted from the cathode surface by ion impact are accelerated by the cathode fall region, then pass right through both the negative glow and the hollow anode, resulting in bombardment to the X-ray window. The fast electrons were utilized as an excitation source in X-ray elemental analysis. It was demonstrated that quantitative analyses of Fe-Si alloys are possible by this electron-excited X-ray emission method.
Original language | English |
---|---|
Pages (from-to) | 863-867 |
Number of pages | 5 |
Journal | BUNSEKI KAGAKU |
Volume | 46 |
Issue number | 11 |
DOIs | |
Publication status | Published - 1997 Nov |
Keywords
- Electron source
- Grimm glow-discharge lamp
- Runaway electron
- X-ray analysis
- X-ray source
ASJC Scopus subject areas
- Analytical Chemistry