Ferromagnetism stabilization of ultrathin SrRuO3 films: Thickness-dependent physical properties

D. Toyota; I. Ohkubo; H. Kumigashira; M. Oshima; T. Ohnishi; M. Lippmaa; M. Kawasaki; H. Koinuma

doi:10.1063/1.2165140

Ferromagnetism stabilization of ultrathin SrRuO₃ films: Thickness-dependent physical properties

D. Toyota, I. Ohkubo, H. Kumigashira, M. Oshima, T. Ohnishi, M. Lippmaa, M. Kawasaki, H. Koinuma

IMRAM - Division of Inorganic Material Research

Research output: Contribution to journal › Article › peer-review

27 Citations (Scopus)

Abstract

Ultrathin films of SrRu O3 (SRO) have been grown on SrTi O3 (001) substrates to study thickness-dependent physical properties. We have revealed the existence of two critical film thicknesses where a metal-insulator transition occurs at a film thickness of 4-6 ML (monolayer) and the value of Curie temperature saturates at about 15 ML. The electrical and magnetic properties are well correlated with the thickness-dependent evolution of surface morphology of the ultrathin SRO films. These experimental results suggest the importance of the disorder associated with the unique growth mode transition in SRO films.

Original language	English
Article number	08N505
Journal	Journal of Applied Physics
Volume	99
Issue number	8
DOIs	https://doi.org/10.1063/1.2165140
Publication status	Published - 2006

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10.1063/1.2165140

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@article{f86e20f826154390b1d3adf6c73786bf,

title = "Ferromagnetism stabilization of ultrathin SrRuO3 films: Thickness-dependent physical properties",

abstract = "Ultrathin films of SrRu O3 (SRO) have been grown on SrTi O3 (001) substrates to study thickness-dependent physical properties. We have revealed the existence of two critical film thicknesses where a metal-insulator transition occurs at a film thickness of 4-6 ML (monolayer) and the value of Curie temperature saturates at about 15 ML. The electrical and magnetic properties are well correlated with the thickness-dependent evolution of surface morphology of the ultrathin SRO films. These experimental results suggest the importance of the disorder associated with the unique growth mode transition in SRO films.",

author = "D. Toyota and I. Ohkubo and H. Kumigashira and M. Oshima and T. Ohnishi and M. Lippmaa and M. Kawasaki and H. Koinuma",

note = "Funding Information: The authors thank Dr. J. Matsuno for their useful discussion. This work was done under Project No. 02S2-002 at the Institute of Materials Structure Science at KEK. This work was supported by a Grant-in-Aid for Scientific Research (A16204024 and S17101004) from the Japan Society for the Promotion of Science.",

year = "2006",

doi = "10.1063/1.2165140",

language = "English",

volume = "99",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "8",

}

TY - JOUR

T1 - Ferromagnetism stabilization of ultrathin SrRuO3 films

T2 - Thickness-dependent physical properties

AU - Toyota, D.

AU - Ohkubo, I.

AU - Kumigashira, H.

AU - Oshima, M.

AU - Ohnishi, T.

AU - Lippmaa, M.

AU - Kawasaki, M.

AU - Koinuma, H.

N1 - Funding Information: The authors thank Dr. J. Matsuno for their useful discussion. This work was done under Project No. 02S2-002 at the Institute of Materials Structure Science at KEK. This work was supported by a Grant-in-Aid for Scientific Research (A16204024 and S17101004) from the Japan Society for the Promotion of Science.

PY - 2006

Y1 - 2006

N2 - Ultrathin films of SrRu O3 (SRO) have been grown on SrTi O3 (001) substrates to study thickness-dependent physical properties. We have revealed the existence of two critical film thicknesses where a metal-insulator transition occurs at a film thickness of 4-6 ML (monolayer) and the value of Curie temperature saturates at about 15 ML. The electrical and magnetic properties are well correlated with the thickness-dependent evolution of surface morphology of the ultrathin SRO films. These experimental results suggest the importance of the disorder associated with the unique growth mode transition in SRO films.

AB - Ultrathin films of SrRu O3 (SRO) have been grown on SrTi O3 (001) substrates to study thickness-dependent physical properties. We have revealed the existence of two critical film thicknesses where a metal-insulator transition occurs at a film thickness of 4-6 ML (monolayer) and the value of Curie temperature saturates at about 15 ML. The electrical and magnetic properties are well correlated with the thickness-dependent evolution of surface morphology of the ultrathin SRO films. These experimental results suggest the importance of the disorder associated with the unique growth mode transition in SRO films.

UR - http://www.scopus.com/inward/record.url?scp=33646736719&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33646736719&partnerID=8YFLogxK

U2 - 10.1063/1.2165140

DO - 10.1063/1.2165140

M3 - Article

AN - SCOPUS:33646736719

SN - 0021-8979

VL - 99

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 8

M1 - 08N505

ER -

Ferromagnetism stabilization of ultrathin SrRuO₃ films: Thickness-dependent physical properties

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