Currents associated with high-speed digital device have significant impacts on EMI problems in VLSI design and operation. In this paper, a simple transmission line model was implemented as an initial step to represent the EMI mechanisms associated with an IC package. Numerical modeling results were compared with near field scanning measurements and show that the magnetic field deduced from the measurements agrees well with the numerical predictions.
|Number of pages
|IEEE International Symposium on Electromagnetic Compatibility
|Published - 2002
- Near field scanning
- Numerical modeling