Field ion-scanning tunneling microscopy

T. Sakurai; T. Hashizume; I. Kamiya; Y. Hasegawa; N. Sano; H. W. Pickering; A. Sakai

doi:10.1016/0079-6816(90)90012-9

Field ion-scanning tunneling microscopy

T. Sakurai, T. Hashizume, I. Kamiya, Y. Hasegawa, N. Sano, H. W. Pickering, A. Sakai

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

A scanning tunneling microscope combined with a field ion microscope, which we call "FI-STM" has been constructed and tested successfully. The details of the principles and performance of the FI-STM are described. Several examples of its applications for Si (111) and Si (100) surfaces are presented as illustrations of the power of the instrument.

Original language	English
Pages (from-to)	3-89
Number of pages	87
Journal	Progress in Surface Science
Volume	33
Issue number	1
DOIs	https://doi.org/10.1016/0079-6816(90)90012-9
Publication status	Published - 1990

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/0079-6816(90)90012-9

Cite this

@article{cc3e7d1d73164cc8add696c547afd29a,

title = "Field ion-scanning tunneling microscopy",

abstract = "A scanning tunneling microscope combined with a field ion microscope, which we call {"}FI-STM{"} has been constructed and tested successfully. The details of the principles and performance of the FI-STM are described. Several examples of its applications for Si (111) and Si (100) surfaces are presented as illustrations of the power of the instrument.",

author = "T. Sakurai and T. Hashizume and I. Kamiya and Y. Hasegawa and N. Sano and Pickering, {H. W.} and A. Sakai",

year = "1990",

doi = "10.1016/0079-6816(90)90012-9",

language = "English",

volume = "33",

pages = "3--89",

journal = "Progress in Surface Science",

issn = "0079-6816",

publisher = "Elsevier Limited",

number = "1",

}

TY - JOUR

T1 - Field ion-scanning tunneling microscopy

AU - Sakurai, T.

AU - Hashizume, T.

AU - Kamiya, I.

AU - Hasegawa, Y.

AU - Sano, N.

AU - Pickering, H. W.

AU - Sakai, A.

PY - 1990

Y1 - 1990

N2 - A scanning tunneling microscope combined with a field ion microscope, which we call "FI-STM" has been constructed and tested successfully. The details of the principles and performance of the FI-STM are described. Several examples of its applications for Si (111) and Si (100) surfaces are presented as illustrations of the power of the instrument.

AB - A scanning tunneling microscope combined with a field ion microscope, which we call "FI-STM" has been constructed and tested successfully. The details of the principles and performance of the FI-STM are described. Several examples of its applications for Si (111) and Si (100) surfaces are presented as illustrations of the power of the instrument.

UR - http://www.scopus.com/inward/record.url?scp=0025682836&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0025682836&partnerID=8YFLogxK

U2 - 10.1016/0079-6816(90)90012-9

DO - 10.1016/0079-6816(90)90012-9

M3 - Article

AN - SCOPUS:0025682836

SN - 0079-6816

VL - 33

SP - 3

EP - 89

JO - Progress in Surface Science

JF - Progress in Surface Science

IS - 1

ER -

Field ion-scanning tunneling microscopy

Abstract

ASJC Scopus subject areas

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