Field ion-scanning tunneling microscopy

T. Sakurai, T. Hashizume, I. Kamiya, Y. Hasegawa, N. Sano, H. W. Pickering, A. Sakai

    Research output: Contribution to journalArticlepeer-review

    6 Citations (Scopus)


    A scanning tunneling microscope combined with a field ion microscope, which we call "FI-STM" has been constructed and tested successfully. The details of the principles and performance of the FI-STM are described. Several examples of its applications for Si (111) and Si (100) surfaces are presented as illustrations of the power of the instrument.

    Original languageEnglish
    Pages (from-to)3-89
    Number of pages87
    JournalProgress in Surface Science
    Issue number1
    Publication statusPublished - 1990

    ASJC Scopus subject areas

    • Chemistry(all)
    • Condensed Matter Physics
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films


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