TY - GEN
T1 - Filterless vacuum ultraviolet photoconductive detector fabricated on NdF3 thin film
AU - Ieda, Mirai
AU - Ishimaru, Tatsuya
AU - Ono, Shingo
AU - Yokota, Yuui
AU - Yanagida, Takayuki
AU - Yoshikawa, Akira
PY - 2012
Y1 - 2012
N2 - The NdF3 thin film grown at 670 K exhibited the maximum photocurrent and the response below 180 nm in sensitivity spectrum. Moreover, the increase in current achieved 4-digit growth before and after VUV illumination. These observed characteristics open up the possibility of high sensitive VUV photoconductive detectors using fluorides.
AB - The NdF3 thin film grown at 670 K exhibited the maximum photocurrent and the response below 180 nm in sensitivity spectrum. Moreover, the increase in current achieved 4-digit growth before and after VUV illumination. These observed characteristics open up the possibility of high sensitive VUV photoconductive detectors using fluorides.
UR - http://www.scopus.com/inward/record.url?scp=84871739278&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84871739278&partnerID=8YFLogxK
U2 - 10.1109/IPCon.2012.6358652
DO - 10.1109/IPCon.2012.6358652
M3 - Conference contribution
AN - SCOPUS:84871739278
SN - 9781457707315
T3 - 2012 IEEE Photonics Conference, IPC 2012
SP - 382
EP - 383
BT - 2012 IEEE Photonics Conference, IPC 2012
T2 - 25th IEEE Photonics Conference, IPC 2012
Y2 - 23 September 2012 through 27 September 2012
ER -