TY - JOUR
T1 - First-principles study of pressure and SiO-incorporation effect on dynamical properties of silicon oxide
AU - Kageshima, Hiroyuki
AU - Yajima, Yuji
AU - Shiraishi, Kenji
AU - Endoh, Tetsuo
N1 - Publisher Copyright:
© 2019 The Japan Society of Applied Physics.
PY - 2019
Y1 - 2019
N2 - The pressure and SiO-incorporation effect on the temperature dependence of dynamical properties for silicon oxide (SiO2)1-x(SiO)x is theoretically studied by first-principles molecular dynamics. It is found that the incorporation of SiO enhances the selfdiffusions even under high pressure. The SiO effect on Si selfdiffusion is however reduced by the pressure at temperature lower than 4000 K, and the amount of reduction is larger for lower temperature, while the effect on O selfdiffusion is hardly reduced, being independent of the temperature. Such a difference is thought to come from the difference in selfdiffusion mechanisms between Si and O. It is indicated that the incorporated SiO acts as combined SiO interstitials rather than separate Si interstitials or O vacancies. This also suggests that the oxide viscous flow mechanism is a promising candidate for the origin of the Si missing in oxidizing Si nanopillars.
AB - The pressure and SiO-incorporation effect on the temperature dependence of dynamical properties for silicon oxide (SiO2)1-x(SiO)x is theoretically studied by first-principles molecular dynamics. It is found that the incorporation of SiO enhances the selfdiffusions even under high pressure. The SiO effect on Si selfdiffusion is however reduced by the pressure at temperature lower than 4000 K, and the amount of reduction is larger for lower temperature, while the effect on O selfdiffusion is hardly reduced, being independent of the temperature. Such a difference is thought to come from the difference in selfdiffusion mechanisms between Si and O. It is indicated that the incorporated SiO acts as combined SiO interstitials rather than separate Si interstitials or O vacancies. This also suggests that the oxide viscous flow mechanism is a promising candidate for the origin of the Si missing in oxidizing Si nanopillars.
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U2 - 10.7567/1347-4065/ab4977
DO - 10.7567/1347-4065/ab4977
M3 - Article
AN - SCOPUS:85076618464
SN - 0021-4922
VL - 58
JO - Japanese Journal of Applied Physics
JF - Japanese Journal of Applied Physics
IS - 11
M1 - 111004
ER -