Foreword :Scanning probe microscopy

Takuji Takahashi; Masami Kageshima; Ken Nakajima; Ken Ichi Fukui; Tadahiro Komeda; Koji Sumitomo; Takayuki Uchihashi; Tomonobu Nakayama

doi:10.7567/JJAP.55.08N001

Foreword :Scanning probe microscopy

Takuji Takahashi, Masami Kageshima, Ken Nakajima, Ken Ichi Fukui, Tadahiro Komeda, Koji Sumitomo, Takayuki Uchihashi, Tomonobu Nakayama

Research output: Contribution to journal › Editorial › peer-review

Original language	English
Article number	08N001
Journal	Japanese journal of applied physics
Volume	55
Issue number	8
DOIs	https://doi.org/10.7567/JJAP.55.08N001
Publication status	Published - 2016 Aug

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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10.7567/JJAP.55.08N001

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title = "Foreword :Scanning probe microscopy",

author = "Takuji Takahashi and Masami Kageshima and Ken Nakajima and Fukui, {Ken Ichi} and Tadahiro Komeda and Koji Sumitomo and Takayuki Uchihashi and Tomonobu Nakayama",

year = "2016",

month = aug,

doi = "10.7567/JJAP.55.08N001",

language = "English",

volume = "55",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",

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publisher = "Japan Society of Applied Physics",

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T1 - Foreword :Scanning probe microscopy

AU - Takahashi, Takuji

AU - Kageshima, Masami

AU - Nakajima, Ken

AU - Fukui, Ken Ichi

AU - Komeda, Tadahiro

AU - Sumitomo, Koji

AU - Uchihashi, Takayuki

AU - Nakayama, Tomonobu

PY - 2016/8

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U2 - 10.7567/JJAP.55.08N001

DO - 10.7567/JJAP.55.08N001

M3 - Editorial

AN - SCOPUS:84983770741

SN - 0021-4922

VL - 55

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

IS - 8

M1 - 08N001

ER -

Foreword :Scanning probe microscopy

ASJC Scopus subject areas

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