Abstract
The formation mechanism of twin boundaries in multicrystalline Si was studied using an in situ observation technique. We directly observed the growing interface and analyzed change in the growth rate. We found that the formation of twin boundaries in crystal grains was always accompanied by a marked increase in the growth rate and they were rarely formed when the growth rate was constant at a high value. The formation mechanism is discussed from the viewpoint of driving force.
Original language | English |
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Pages (from-to) | 556-559 |
Number of pages | 4 |
Journal | Scripta Materialia |
Volume | 65 |
Issue number | 6 |
DOIs | |
Publication status | Published - 2011 Sept |
Keywords
- Crystal growth
- In situ
- Polycrystal
- Silicon
- Twin boundary
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
- Metals and Alloys