TY - JOUR
T1 - Four-Circle Neutron Diffractometer FONDER at JRR-3
T2 - Quantitative Reciprocal-Space Measurements in Structural Physics
AU - Takahashi, Miwako
AU - Noda, Yukio
AU - Kobayashi, Satoru
AU - Sato, Taku J.
AU - Nawa, Kazuhiro
AU - Sakakura, Terutoshi
AU - Ishikawa, Yoshihisa
AU - Kimura, Hiroyuki
N1 - Publisher Copyright:
©2024 The Physical Society of Japan.
PY - 2024/9/15
Y1 - 2024/9/15
N2 - The Four-circle Off-centered Neutron DiffractometER (FONDER), which is a four-circle neutron diffractometer used to study structures under various sample environments with single crystals, has been revealed to be an efficient instrument not only for the measurement of crystal and magnetic structural analyses, but also for the quantitative measurements of superlattice reflections and diffuse scattering. Here, the performance of FONDER and the comparison of its use with the curved two-dimensional position sensitive detector (C-2DPSD) are described, and studies using FONDER for the structural analyses of trehalose dihydrate, the multiferroic compound RMn2O5, and short-range magnetic ordering in Pt–Mn alloys are reviewed. The prospects for combining the technique with X-ray or time-of-flight (TOF) Laue diffraction techniques are discussed.
AB - The Four-circle Off-centered Neutron DiffractometER (FONDER), which is a four-circle neutron diffractometer used to study structures under various sample environments with single crystals, has been revealed to be an efficient instrument not only for the measurement of crystal and magnetic structural analyses, but also for the quantitative measurements of superlattice reflections and diffuse scattering. Here, the performance of FONDER and the comparison of its use with the curved two-dimensional position sensitive detector (C-2DPSD) are described, and studies using FONDER for the structural analyses of trehalose dihydrate, the multiferroic compound RMn2O5, and short-range magnetic ordering in Pt–Mn alloys are reviewed. The prospects for combining the technique with X-ray or time-of-flight (TOF) Laue diffraction techniques are discussed.
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U2 - 10.7566/JPSJ.93.091006
DO - 10.7566/JPSJ.93.091006
M3 - Article
AN - SCOPUS:85198578438
SN - 0031-9015
VL - 93
JO - Journal of the Physical Society of Japan
JF - Journal of the Physical Society of Japan
IS - 9
M1 - 091006
ER -