Frustration of photoionization of Ar nanoplasma produced by extreme ultraviolet FEL pulses

H. Iwayama; K. Nagaya; M. Yao; H. Fukuzawa; X. J. Liu; G. Prümper; K. Motomura; K. Ueda; N. Saito; A. Rudenko; L. Foucar; M. Nagasono; A. Higashiya; M. Yabashi; T. Ishikawa; H. Ohashi; H. Kimura

doi:10.1088/0953-4075/46/16/164019

Frustration of photoionization of Ar nanoplasma produced by extreme ultraviolet FEL pulses

H. Iwayama, K. Nagaya, M. Yao, H. Fukuzawa, X. J. Liu, G. Prümper, K. Motomura, K. Ueda, N. Saito, A. Rudenko, L. Foucar, M. Nagasono, A. Higashiya, M. Yabashi, T. Ishikawa, H. Ohashi, H. Kimura

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10 Citations (Scopus)

Abstract

We report on the laser power dependence of photoabsorptions of Ar clusters irradiated by extreme ultraviolet-free electron laser (EUV-FEL) at the wavelength of 62 nm. We measured kinetic energy distributions of fragment ions with our ion momentum spectrometer. From the measured kinetic energy distributions, we estimated charge states of irradiated Ar clusters using the classical uniformly charged sphere model. Our results show that the EUV-FEL irradiation of Ar clusters results in the frustration of direct photoionization leading to nanoplasma formation and subsequent strong electron-ion charge recombination.

Original language	English
Article number	164019
Journal	Journal of Physics B: Atomic, Molecular and Optical Physics
Volume	46
Issue number	16
DOIs	https://doi.org/10.1088/0953-4075/46/16/164019
Publication status	Published - 2013 Aug 28

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Condensed Matter Physics

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Iwayama, H., Nagaya, K., Yao, M., Fukuzawa, H., Liu, X. J., Prümper, G., Motomura, K., Ueda, K., Saito, N., Rudenko, A., Foucar, L., Nagasono, M., Higashiya, A., Yabashi, M., Ishikawa, T., Ohashi, H., & Kimura, H. (2013). Frustration of photoionization of Ar nanoplasma produced by extreme ultraviolet FEL pulses. Journal of Physics B: Atomic, Molecular and Optical Physics, 46(16), [164019]. https://doi.org/10.1088/0953-4075/46/16/164019

Iwayama, H, Nagaya, K, Yao, M, Fukuzawa, H, Liu, XJ, Prümper, G, Motomura, K, Ueda, K, Saito, N, Rudenko, A, Foucar, L, Nagasono, M, Higashiya, A, Yabashi, M, Ishikawa, T, Ohashi, H & Kimura, H 2013, 'Frustration of photoionization of Ar nanoplasma produced by extreme ultraviolet FEL pulses', Journal of Physics B: Atomic, Molecular and Optical Physics, vol. 46, no. 16, 164019. https://doi.org/10.1088/0953-4075/46/16/164019

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title = "Frustration of photoionization of Ar nanoplasma produced by extreme ultraviolet FEL pulses",

abstract = "We report on the laser power dependence of photoabsorptions of Ar clusters irradiated by extreme ultraviolet-free electron laser (EUV-FEL) at the wavelength of 62 nm. We measured kinetic energy distributions of fragment ions with our ion momentum spectrometer. From the measured kinetic energy distributions, we estimated charge states of irradiated Ar clusters using the classical uniformly charged sphere model. Our results show that the EUV-FEL irradiation of Ar clusters results in the frustration of direct photoionization leading to nanoplasma formation and subsequent strong electron-ion charge recombination.",

author = "H. Iwayama and K. Nagaya and M. Yao and H. Fukuzawa and Liu, {X. J.} and G. Pr{\"u}mper and K. Motomura and K. Ueda and N. Saito and A. Rudenko and L. Foucar and M. Nagasono and A. Higashiya and M. Yabashi and T. Ishikawa and H. Ohashi and H. Kimura",

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doi = "10.1088/0953-4075/46/16/164019",

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T1 - Frustration of photoionization of Ar nanoplasma produced by extreme ultraviolet FEL pulses

AU - Iwayama, H.

AU - Nagaya, K.

AU - Yao, M.

AU - Fukuzawa, H.

AU - Liu, X. J.

AU - Prümper, G.

AU - Motomura, K.

AU - Ueda, K.

AU - Saito, N.

AU - Rudenko, A.

AU - Foucar, L.

AU - Nagasono, M.

AU - Higashiya, A.

AU - Yabashi, M.

AU - Ishikawa, T.

AU - Ohashi, H.

AU - Kimura, H.

PY - 2013/8/28

Y1 - 2013/8/28

N2 - We report on the laser power dependence of photoabsorptions of Ar clusters irradiated by extreme ultraviolet-free electron laser (EUV-FEL) at the wavelength of 62 nm. We measured kinetic energy distributions of fragment ions with our ion momentum spectrometer. From the measured kinetic energy distributions, we estimated charge states of irradiated Ar clusters using the classical uniformly charged sphere model. Our results show that the EUV-FEL irradiation of Ar clusters results in the frustration of direct photoionization leading to nanoplasma formation and subsequent strong electron-ion charge recombination.

AB - We report on the laser power dependence of photoabsorptions of Ar clusters irradiated by extreme ultraviolet-free electron laser (EUV-FEL) at the wavelength of 62 nm. We measured kinetic energy distributions of fragment ions with our ion momentum spectrometer. From the measured kinetic energy distributions, we estimated charge states of irradiated Ar clusters using the classical uniformly charged sphere model. Our results show that the EUV-FEL irradiation of Ar clusters results in the frustration of direct photoionization leading to nanoplasma formation and subsequent strong electron-ion charge recombination.

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JF - Journal of Physics B: Atomic, Molecular and Optical Physics

IS - 16

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ER -

Frustration of photoionization of Ar nanoplasma produced by extreme ultraviolet FEL pulses

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