TY - JOUR
T1 - Fully automatic thin film permeameter
AU - Yabukami, S.
AU - Yamaguchi, M.
AU - Arai, K. I.
AU - Ando, H.
AU - Itagaki, A.
AU - Watanabe, M.
PY - 1999
Y1 - 1999
N2 - A high-speed, fully-automatic, broad-bandwidth thin film permeameter was developed to account for magnetic films used in high frequency magnetic devices. Automatic measurements were realized through extensive investigations on automatic calibration procedure to obtain an absolute permeance value, interference between electric equipment and jig of permeameter, and noise reduction inside the jig.
AB - A high-speed, fully-automatic, broad-bandwidth thin film permeameter was developed to account for magnetic films used in high frequency magnetic devices. Automatic measurements were realized through extensive investigations on automatic calibration procedure to obtain an absolute permeance value, interference between electric equipment and jig of permeameter, and noise reduction inside the jig.
UR - http://www.scopus.com/inward/record.url?scp=0033299405&partnerID=8YFLogxK
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U2 - 10.1109/intmag.1999.837190
DO - 10.1109/intmag.1999.837190
M3 - Conference article
AN - SCOPUS:0033299405
SN - 0074-6843
SP - AQ-02
JO - Digests of the Intermag Conference
JF - Digests of the Intermag Conference
T2 - Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99'
Y2 - 18 May 1999 through 21 May 1999
ER -