TY - JOUR
T1 - Fundamental study of surface layer on ferroelectrics by scanning nonlinear dielectric microscopy
AU - Ohara, K.
AU - Cho, Y.
PY - 2001/9
Y1 - 2001/9
N2 - Distribution and growth of very thin surface layers on ferroelectric materials are investigated by scanning nonlinear dielectric microscopy. This microscopy technique involves the measurement of higher order nonlinear dielectric constants, with depth resolution down to one unit cell order. By changing the order of nonlinearity of the dielectric response, we obtain information about the surface layer on lead zirconate titanate (PZT) thin film and also observe the growth process of a surface paraelectric layer on LiNhO3 single crystal.
AB - Distribution and growth of very thin surface layers on ferroelectric materials are investigated by scanning nonlinear dielectric microscopy. This microscopy technique involves the measurement of higher order nonlinear dielectric constants, with depth resolution down to one unit cell order. By changing the order of nonlinearity of the dielectric response, we obtain information about the surface layer on lead zirconate titanate (PZT) thin film and also observe the growth process of a surface paraelectric layer on LiNhO3 single crystal.
KW - Nonlinear dielectric constant
KW - Scanning nonlinear dielectric microscopy
KW - Scanning probe microscopy
KW - Surface layer
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U2 - 10.1143/jjap.40.5833
DO - 10.1143/jjap.40.5833
M3 - Article
AN - SCOPUS:0035455317
SN - 0021-4922
VL - 40
SP - 5833
EP - 5836
JO - Japanese Journal of Applied Physics
JF - Japanese Journal of Applied Physics
IS - 9 B
ER -