Fundamental study on nano domain engineering using scanning nonlinear dielectric microscopy

K. Matsuura, Y. Cho, H. Odagawa

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)


Scanning nonlinear dielectric microscopy (SNDM) is the first successful purely electrical method for observing the ferroelectric domain on the sub-nanometer order. As another high-resolution method for measuring ferroelectric domains, the piezoelectric response imaging method is often reported. In this study, it is confirmed that SNDM has a much higher resolution than piezoelectric imaging under the same experimental condition using the same system. First, the resolution of SNDM is described, and then, the resolution of SNDM is compared with that of piezoelectric imaging. Finally, a fundamental study for applying the SNDM system to a ferroelectric reading-recording system is performed, and it is concluded that SNDM has sufficient performance for application to the ferroelectric memory system.

Original languageEnglish
Pages (from-to)4354-4356
Number of pages3
JournalJapanese Journal of Applied Physics
Issue number6 B
Publication statusPublished - 2001 Jun


  • Concentration of electric field under the tip
  • Engineered small ferroelectric domains
  • Nonlinear dielectric response
  • Piezoelectric response
  • Scanning nonlinear dielectric microscopy


Dive into the research topics of 'Fundamental study on nano domain engineering using scanning nonlinear dielectric microscopy'. Together they form a unique fingerprint.

Cite this