TY - GEN
T1 - Future high density memory with vertical structured device technology
AU - Endoh, Tetsuo
PY - 2010
Y1 - 2010
N2 - For the past thirty years, the downscaling has been the guiding principle in the field of High-density semiconductor memories. However, recently, the limit of planar bulk MOSFETs is becoming apparent. Therefore, in order to extend the scalability of memory technology to the nano-scale generation, a new device structure is necessary. From the viewpoint, I will discuss future High density Memory with Vertical structured device technology.
AB - For the past thirty years, the downscaling has been the guiding principle in the field of High-density semiconductor memories. However, recently, the limit of planar bulk MOSFETs is becoming apparent. Therefore, in order to extend the scalability of memory technology to the nano-scale generation, a new device structure is necessary. From the viewpoint, I will discuss future High density Memory with Vertical structured device technology.
UR - http://www.scopus.com/inward/record.url?scp=78751619890&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=78751619890&partnerID=8YFLogxK
U2 - 10.1109/ICSICT.2010.5667541
DO - 10.1109/ICSICT.2010.5667541
M3 - Conference contribution
AN - SCOPUS:78751619890
SN - 9781424457984
T3 - ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings
SP - 1051
EP - 1054
BT - ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings
T2 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology
Y2 - 1 November 2010 through 4 November 2010
ER -